Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Coates & Welter SEM Mount 3/4" Head, 3/8 " Pin diameter, Aluminum
Coates & Welter aluminum specimen mounts for scanning electron microscopes.
Head: 3/4"
Pin diameter: 3/8"
Electron Microscopy Sciences Coates & Welter SEM Mount 3/4" Head, 3/8 " Pin diameter, Aluminum
Coates & Welter aluminum specimen mounts for scanning electron microscopes.
Head: 3/4"
Pin diameter: 3/8"
Electron Microscopy Sciences Scanning Electron Microscope Finder Grid, Copper
Finder grids for SEM; a valuable tool for analytical studies. The grids are available in 10 mm diameter and they can be placed directly on the stub surface and used to identify the area of interest in which the studies are performed.
Electron Microscopy Sciences Stage Micrometer S21, Scale, 5.0 mm Length
Stage graticules are used for the routine calibration of eyepiece patterns, particularly when alternating between objectives on one microscope or when using the same graticule in different microscopes. Their robust construction makes them ideal for student use and for instructional purposes. The scale or grid is centered on a glass disc mounted in a black anodized aluminum slide 75 mm x 24 mm x 2 mm thick.
Length: 5.0 mm
Divisions: 5 mm in 0.5 mm , 2 mm in 0.1 mm , and 0.2 mm in 0.01 mm
Electron Microscopy Sciences Poly-View for Negatives, 3- 1/4 x4"
Completely transparent polyethylene storage sheets fits all U.S. standard 3-ring binders: 8 1/4"x1 1/4". Convenient. Offers good protection for your valuable negatives and prints.
Size: 3-1/4 x 4"
Electron Microscopy Sciences Chessy Test Specimen
This precise SEM calibration specimen consist of more than 1.6 million gold squares of 1 size on silicon forming a 4-fold checkerboard pattern in an area of 5 mm square. The smallest metric checkerboard has a size of 10 x 10. Such checkerboards form larger metric checkerboards of 100 x 100 - These again form checkerboards of 1 mm square. Finally, such 1mm squares are arranged in the same manner covering a field of 5 mm square.
The edges of the empty corners in 0.1 and 1 mm checkerboards are additionally marked. The surrounding frame is 10 wide and has an outer side length of 5.04 mm. The pattern was directly written by e-beam lithography using the new ZBA 31/32 from JENOPTIK.
Electron Microscopy Sciences BEEM Cap Holder Set Multi Task
The Multi-Task BEEM Capsule Holder is designed to hold size "00" BEEM capsule during resin polymerization. Use whenembedding and polymerizing resin by microwave under water. The direct contact of the microwave energy to the resin causes the resin to heat to quick and leads to micro bubbles inside the resin block and possible damage to the tissues. This is eliminated by immersing the resin capsule in a water bath during microwaving. This indirect contact' of microwave energy to the resin will help the embedding block polymerize nicely and homogeneously and avoids the overheating of the tissue.
Mold is machined from polyethylene block, comes in two parts: bottom part which holds the BEEM capsule, and the second part which is placed on top and is securd by two plastic screws to ensure the BEEM capsules are in place and capsule lid will not pop out during under water polymerization or microwave irradiation.
Electron Microscopy Sciences EMS Conductive Gold-Paste 2 GR
This EMS Conductive Gold-Paste is a one part adhesive. Fast drying–dries at room temperature. Maximum service temperature is 65 degree C. This adhesive is not for permanent use, useful for testing and temporary work where a high signal is required from the adhesive. Gold content is ~75%, including sphere sizes < 2 um, and flake size <10 um, in organic binders and a solvent. Keep refrigerated for good shelf life. Sheet resistance is 0.02 to 0.05 ohm-cm @ 1 mil thickness.
Structure Probe Inc SILVER PASTE 30G
SPI Conductive Silver Paste Plus, Plus is a high purity, Uniform, Viscous silver particle suspension, Ideal for SEM use, Especially for the mounting of porous samples, 30g
Electron Microscopy Sciences Gilder Finder Grid HF3, 200 mesh Nickel Grid
Used to identify specific areas of mesh by an alphabetical or numerical code built into the mesh. 3.05 mm diameter, 0.7 mil (18 um) thickness. G200HF3 has 322 grids squares and each can be identified by reference to its unique combination of base 2 binary number and alphabet symbol (A-T).
Grid: Nickel
Pitch: 125 µm
Electron Microscopy Sciences SEM Hitachi M4 Double 90°, 1" Head with 16 mm Pin, Aluminum
Hitachi double 90 degree SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 1"
Height: 16 mm
Electron Microscopy Sciences Crossed Gauge Lines Microscope Graticule NE 54, 16mm
Use as crossed lines, but for the measuring of distances between thelines. Greater accuracy can be obtained by locatng the specimen detail between the graticules gauge pair.
Size: 16mm
Divisions: Two vertical lines 0.2 mm apart
Electron Microscopy Sciences High Resolution Magnification Calibration Specimen 150-2D choose the mount
Model 150-2D is a very high resolution reference and traceable standards for magnification calibration of AFM, SEM, Auger, and FIB. It has a precision, holographic pattern that provides accurate calibration in the horizontal plane for very high resolution, nanometer-scale measurements.
The period is 144 nm pitch, two-dimensional array that is accurate to +/- 1 nm (calibration certificate will have actual pitch.) Surface: Aluminum bumps on Silicon, 4x3 mm die. Bump height (about 90 nm) and width (about 75 nm) are not calibrated.
For SEM an independent analytical lab has tested this specimen in a FE-SEM and found that the pattern was very uniform and the specimen was easy to image. No significant charging was observed in the voltage range 1-20 kV. Comes with a non-traceable, manufacturer's certificate.